SN74ABT18646PM
For Reference Only
| Part Number | SN74ABT18646PM |
| PNEDA Part # | SN74ABT18646PM |
| Description | IC SCAN-TEST-DEV/TXRX 64-LQFP |
| Manufacturer | Texas Instruments |
| Unit Price | Request a Quote |
| In Stock | 8,700 |
| Warehouses | Shipped from Hong Kong SAR |
| Estimated Delivery | May 5 - May 10 (Choose Expedited Shipping) |
| Guarantee | Up to 1 year [PNEDA-Warranty]* |
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Free shipping on orders over $100. PNEDA is willing to provide you with better services.
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SN74ABT18646PM Resources
| Brand | Texas Instruments |
| ECAD Module |
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| Mfr. Part Number | SN74ABT18646PM |
| Category | Semiconductors › Logic ICs › Logic - Specialty Logic |
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Logistics Mode
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SN74ABT18646PM Specifications
| Manufacturer | |
| Series | 74ABT |
| Logic Type | Scan Test Device With Transceivers And Registers |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 18 |
| Operating Temperature | -40°C ~ 85°C |
| Mounting Type | Surface Mount |
| Package / Case | 64-LQFP |
| Supplier Device Package | 64-LQFP (10x10) |
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Manufacturer Series 74LVTH Logic Type ABT Scan Test Device With Universal Bus Transceivers Supply Voltage 2.7V ~ 3.6V Number of Bits 18 Operating Temperature -40°C ~ 85°C Mounting Type Surface Mount Package / Case 64-LQFP Supplier Device Package 64-LQFP (10x10) |
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