SN74BCT8374ADWRE4
For Reference Only
| Part Number | SN74BCT8374ADWRE4 |
| PNEDA Part # | SN74BCT8374ADWRE4 |
| Description | IC SCAN TEST DEVICE W/FF 24-SOIC |
| Manufacturer | Texas Instruments |
| Unit Price | Request a Quote |
| In Stock | 2,952 |
| Warehouses | Shipped from Hong Kong SAR |
| Estimated Delivery | Jun 13 - Jun 18 (Choose Expedited Shipping) |
| Guarantee | Up to 1 year [PNEDA-Warranty]* |
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Free shipping on orders over $100. PNEDA is willing to provide you with better services.
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SN74BCT8374ADWRE4 Resources
| Brand | Texas Instruments |
| ECAD Module |
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| Mfr. Part Number | SN74BCT8374ADWRE4 |
| Category | Semiconductors › Logic ICs › Logic - Specialty Logic |
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Logistics Mode
- Delivery time: At the same day (Order deadline is 2pm, HK Time).
- Delivery date: usually 2 to 7 working days.
- It is unable to appoint a date of delivery.
- Tracking number will be sent once your order has been shipped.
- It may take up to 24 hours before carriers display the info.
Notes
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- Orders cannot be canceled after shipping the packages.
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SN74BCT8374ADWRE4 Specifications
| Manufacturer | |
| Series | 74BCT |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Operating Temperature | 0°C ~ 70°C |
| Mounting Type | Surface Mount |
| Package / Case | 24-SOIC (0.295", 7.50mm Width) |
| Supplier Device Package | 24-SOIC |
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