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SN74BCT8374ADWRE4

SN74BCT8374ADWRE4

For Reference Only

Part Number SN74BCT8374ADWRE4
PNEDA Part # SN74BCT8374ADWRE4
Description IC SCAN TEST DEVICE W/FF 24-SOIC
Manufacturer Texas Instruments
Unit Price Request a Quote
In Stock 2,952
Warehouses Shipped from Hong Kong SAR
Estimated Delivery Jun 13 - Jun 18 (Choose Expedited Shipping)
Guarantee Up to 1 year [PNEDA-Warranty]*

SN74BCT8374ADWRE4 Resources

Brand Texas Instruments
ECAD Module ECAD
Mfr. Part NumberSN74BCT8374ADWRE4
CategorySemiconductorsLogic ICsLogic - Specialty Logic

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SN74BCT8374ADWRE4 Specifications

Manufacturer
Series74BCT
Logic TypeScan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage4.5V ~ 5.5V
Number of Bits8
Operating Temperature0°C ~ 70°C
Mounting TypeSurface Mount
Package / Case24-SOIC (0.295", 7.50mm Width)
Supplier Device Package24-SOIC

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