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SN74BCT8374ANTG4

SN74BCT8374ANTG4

For Reference Only

Part Number SN74BCT8374ANTG4
PNEDA Part # SN74BCT8374ANTG4
Description IC SCAN TEST DEVICE W/FF 24-DIP
Manufacturer Texas Instruments
Unit Price Request a Quote
In Stock 3,996
Warehouses Shipped from Hong Kong SAR
Estimated Delivery Jun 18 - Jun 23 (Choose Expedited Shipping)
Guarantee Up to 1 year [PNEDA-Warranty]*

SN74BCT8374ANTG4 Resources

Brand Texas Instruments
ECAD Module ECAD
Mfr. Part NumberSN74BCT8374ANTG4
CategorySemiconductorsLogic ICsLogic - Specialty Logic

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SN74BCT8374ANTG4 Specifications

Manufacturer
Series74BCT
Logic TypeScan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage4.5V ~ 5.5V
Number of Bits8
Operating Temperature0°C ~ 70°C
Mounting TypeThrough Hole
Package / Case24-DIP (0.300", 7.62mm)
Supplier Device Package24-PDIP

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