SN74LVTH182512DGGR
For Reference Only
| Part Number | SN74LVTH182512DGGR |
| PNEDA Part # | SN74LVTH182512DGGR |
| Description | IC SCAN-TEST-DEV/XCVR 64-TSSOP |
| Manufacturer | Texas Instruments |
| Unit Price | Request a Quote |
| In Stock | 4,932 |
| Warehouses | Shipped from Hong Kong SAR |
| Estimated Delivery | Jun 26 - Jul 1 (Choose Expedited Shipping) |
| Guarantee | Up to 1 year [PNEDA-Warranty]* |
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Free shipping on orders over $100. PNEDA is willing to provide you with better services.
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SN74LVTH182512DGGR Resources
| Brand | Texas Instruments |
| ECAD Module |
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| Mfr. Part Number | SN74LVTH182512DGGR |
| Category | Semiconductors › Logic ICs › Logic - Specialty Logic |
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SN74LVTH182512DGGR Specifications
| Manufacturer | |
| Series | 74LVTH |
| Logic Type | ABT Scan Test Device With Universal Bus Transceivers |
| Supply Voltage | 2.7V ~ 3.6V |
| Number of Bits | 18 |
| Operating Temperature | -40°C ~ 85°C |
| Mounting Type | Surface Mount |
| Package / Case | 64-TFSOP (0.240", 6.10mm Width) |
| Supplier Device Package | 64-TSSOP |
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