SN74BCT8374ADWR
For Reference Only
| Part Number | SN74BCT8374ADWR |
| PNEDA Part # | SN74BCT8374ADWR |
| Description | IC SCAN TEST DEVICE W/FF 24-SOIC |
| Manufacturer | Texas Instruments |
| Unit Price | Request a Quote |
| In Stock | 7,290 |
| Warehouses | Shipped from Hong Kong SAR |
| Estimated Delivery | Jun 13 - Jun 18 (Choose Expedited Shipping) |
| Guarantee | Up to 1 year [PNEDA-Warranty]* |
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Free shipping on orders over $100. PNEDA is willing to provide you with better services.
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SN74BCT8374ADWR Resources
| Brand | Texas Instruments |
| ECAD Module |
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| Mfr. Part Number | SN74BCT8374ADWR |
| Category | Semiconductors › Logic ICs › Logic - Specialty Logic |
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SN74BCT8374ADWR Specifications
| Manufacturer | |
| Series | 74BCT |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Operating Temperature | 0°C ~ 70°C |
| Mounting Type | Surface Mount |
| Package / Case | 24-SOIC (0.295", 7.50mm Width) |
| Supplier Device Package | 24-SOIC |
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Manufacturer Series 74BCT Logic Type Scan Test Device with D-Type Edge-Triggered Flip-Flops Supply Voltage 4.5V ~ 5.5V Number of Bits 8 Operating Temperature 0°C ~ 70°C Mounting Type Through Hole Package / Case 24-DIP (0.300", 7.62mm) Supplier Device Package 24-PDIP |
